This setting lets you change the way you view articles. You can choose to have articles open in a dialog window, a new tab, or directly in the same window.
Open in Dialog
Open in New Tab
Open in same window

American Economic Review: Vol. 104 No. 2 (February 2014)

Expand

Quick Tools:

Print Article Summary
Export Citation
Sign up for Email Alerts Follow us on Twitter

Explore:

AER - All Issues

AER Forthcoming Articles

Tracing Value-Added and Double Counting in Gross Exports

Article Citation

Koopman, Robert, Zhi Wang, and Shang-Jin Wei. 2014. "Tracing Value-Added and Double Counting in Gross Exports." American Economic Review, 104(2): 459-94.

DOI: 10.1257/aer.104.2.459

Abstract

This paper proposes an accounting framework that breaks up a country's gross exports into various value-added components by source and additional double-counted terms. Our parsimonious framework bridges a gap between official trade statistics (in gross value terms) and national accounts (in value-added terms), and integrates all previous measures of vertical specialization and value-added trade in the literature into a unified framework. To illustrate the potential of such a method, we present a number of applications including re-computing revealed comparative advantages and the magnifying impact of multi-stage production on trade costs.

Article Full-Text Access

Full-text Article

Additional Materials

Authors

Koopman, Robert (US International Trade Commission)
Wang, Zhi (US International Trade Commission)
Wei, Shang-Jin (Columbia U and CIER, Tsinghua U)

JEL Classifications

E01: Measurement and Data on National Income and Product Accounts and Wealth; Environmental Accounts
E16: General Aggregative Models: Social Accounting Matrix
F14: Empirical Studies of Trade
F23: Multinational Firms; International Business
L14: Transactional Relationships; Contracts and Reputation; Networks


American Economic Review


Quick Tools:

Sign up for Email Alerts

Follow us on Twitter

Subscription Information
(Institutional Administrator Access)

Explore:

AER - All Issues

AER - Forthcoming Articles

Virtual Field Journals


AEA Member Login:


AEAweb | AEA Journals | Contact Us