American Economic Journal: Applied Economics: Vol. 6 No. 3 (July 2014)

Expand

Quick Tools:

Print Article Summary
Export Citation
Sign up for Email Alerts Follow us on Twitter Subscription Information
(Institutional Administrator Access)

Explore:

AEJ: Applied - All Issues

AEJ: Applied Forthcoming Articles

The Impact of Attending a School with High-Achieving Peers: Evidence from the New York City Exam Schools

Article Citation

Dobbie, Will, and Roland G. Fryer. 2014. "The Impact of Attending a School with High-Achieving Peers: Evidence from the New York City Exam Schools." American Economic Journal: Applied Economics, 6(3): 58-75.

DOI: 10.1257/app.6.3.58

Abstract

This paper uses data from three prominent exam high schools in New York City to estimate the impact of attending a school with high-achieving peers on college enrollment and graduation. Our identification strategy exploits sharp discontinuities in the admissions process. Applicants just eligible for an exam school have peers that score 0.17 to 0.36 standard deviations higher on eighth grade state tests and that are 6.4 to 9.5 percentage points less likely to be black or Hispanic. However, exposure to these higher-achieving and more homogeneous peers has little impact on college enrollment, college graduation, or college quality.

Article Full-Text Access

Full-text Article

Additional Materials

Authors

Dobbie, Will (Princeton U)
Fryer, Roland G. Jr. (Harvard U)

JEL Classifications

H75: State and Local Government: Health; Education; Welfare; Public Pensions
I21: Analysis of Education
J15: Economics of Minorities, Races, Indigenous Peoples, and Immigrants; Non-labor Discrimination

Comments

View Comments on This Article (0) | Login to post a comment


American Economic Journal: Applied Economics


Quick Tools:

Sign up for Email Alerts

Follow us on Twitter

Subscription Information
(Institutional Administrator Access)

Explore:

AEJ: Applied - All Issues

AEJ: Applied - Forthcoming Articles

Virtual Field Journals


AEA Member Login:


AEAweb | AEA Journals | Contact Us