American Economic Journal: Applied Economics: Vol. 6 No. 3 (July 2014)

Expand

Quick Tools:

Print Article Summary
Export Citation
Sign up for Email Alerts Follow us on Twitter Subscription Information
(Institutional Administrator Access)

Explore:

AEJ: Applied - All Issues

AEJ: Applied Forthcoming Articles

Effects of School Quality on Student Achievement: Discontinuity Evidence from Kenya

Article Citation

Lucas, Adrienne M., and Isaac M. Mbiti. 2014. "Effects of School Quality on Student Achievement: Discontinuity Evidence from Kenya." American Economic Journal: Applied Economics, 6(3): 234-63.

DOI: 10.1257/app.6.3.234

Abstract

The most desirable Kenyan secondary schools are elite government schools that admit the best students from across the country. We exploit the random variation generated by the centralized school admissions process in a regression discontinuity design to obtain causal estimates of the effects of attending one of these elite public schools on student progression and test scores in secondary school. Despite their reputations, we find little evidence of positive impacts on learning outcomes for students who attended these schools, suggesting that their sterling reputations reflect the selection of students rather than their ability to generate value-added test score gains.

Article Full-Text Access

Full-text Article

Additional Materials

Authors

Lucas, Adrienne M. (U DE)
Mbiti, Isaac M. (Southern Methodist U)

JEL Classifications

H52: National Government Expenditures and Education
I21: Analysis of Education
I28: Education: Government Policy
O15: Economic Development: Human Resources; Human Development; Income Distribution; Migration

Comments

View Comments on This Article (0) | Login to post a comment


American Economic Journal: Applied Economics


Quick Tools:

Sign up for Email Alerts

Follow us on Twitter

Subscription Information
(Institutional Administrator Access)

Explore:

AEJ: Applied - All Issues

AEJ: Applied - Forthcoming Articles

Virtual Field Journals


AEA Member Login:


AEAweb | AEA Journals | Contact Us